 |
ModifiedGammaStatisticTInstance Class |
Implements an internal evaluation method based on a modified/improved version of Hubert's Gamma (Γ) statistic in
[1] with the transformation introduced in [2] in order to be maximized.
Inheritance HierarchySystemObject Aglomera.Evaluation.InternalModifiedGammaStatisticTInstance
Namespace:
Aglomera.Evaluation.Internal
Assembly:
Aglomera (in Aglomera.dll) Version: 1.1.0
Syntaxpublic class ModifiedGammaStatistic<TInstance> : IInternalEvaluationCriterion<TInstance>
where TInstance : Object, IComparable<TInstance>
Request Example
View SourceType Parameters
- TInstance
- The type of instance considered.
The ModifiedGammaStatisticTInstance type exposes the following members.
Constructors
Properties
| Name | Description |
---|
 | DissimilarityMetric |
Gets the metric used by this criterion to measure the dissimilarity / distance between cluster elements.
|
Top
Methods
Remarks
Notes:
- "The improved Hubert Γ statistic describes the degree of a partition fitting the data set. [...] The partition
number fitting data set may be discovered from the plot of Γ versus n, however, it is difficult to find the
inflexion from the plot and it is possible that the partition number obtained is just close to the best solution,
but not that we want. So, it is not feasible in practice to determine the optimal partition by the plot of Γ versus
n directly. [...] In the plot of [transformed Γ] versus [number of clusters c], Γ goes to zero with c close to n,
and a max peak value that corresponds to a significant increase of c can be found. The number of clusters at which
the peak value occurs is equal to the number of clusters fitting the data." [2]
References:
[1] -
Hubert, L., & Arabie, P. (1985). Comparing partitions. Journal of classification, 2(1), 193-218.
[2] -
Zhao, H., Liang, J., & Hu, H. (2006, August). Clustering Validity Based on the Improved Hubert\Gamma
Statistic and the Separation of Clusters. In First International Conference on Innovative Computing,
Information and Control, 2006. ICICIC'06. (Vol. 2, pp. 539-543). IEEE.
See Also